Aehr to Showcase FOX-P(TM) Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

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More Recent News About Aehr Test Systems

Aehr Test Systems Reports Third Quarter Fiscal 2024 Financial Results and Reiterates Fiscal 2024 Full Year Financial Guidance
Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
Aehr Test Systems to Announce Third Quarter Fiscal 2024 Financial Results on April 9, 2024
Aehr Receives Order from New Customer for FOX(TM) Wafer Level Burn-in System for Silicon Carbide Semiconductors for Electric Vehicles
Aehr Test Systems Reports 89% Revenue Growth Year over Year in First Quarter of Fiscal 2023 on Strength of Wafer Level Test and Burn-in of Silicon Carbide Devices used in Electric Vehicles
Aehr Announces New Advanced Testing Capabilities on its FOX-P(TM) Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies
Aehr Test Systems to Announce First Quarter Fiscal 2023 Financial Results on October 6, 2022
Aehr Test Systems CEO to Present at the EU Power Semiconductor Executive Summit in Munich, Germany on September 19, 2022

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